A Novel Test Point Selection Method for Analog Fault Dictionary Techniques

Chenglin Yang; Shulin Tian; Bing Long; Fang Chen

doi:10.1007/s10836-010-5169-4

ScienceGate Book Chapters

JOURNAL ARTICLE

A Novel Test Point Selection Method for Analog Fault Dictionary Techniques

Chenglin Yang Shulin Tian Bing Long Fang Chen

Year: 2010 Journal: Journal of Electronic Testing Vol: 26 (5)Pages: 523-534 Publisher: Springer Science+Business Media

DOI: 10.1007/s10836-010-5169-4

Get Full-Text PDF Get Analytical Report

Keywords:

Selection (genetic algorithm) Computer science Table (database) Algorithm Point (geometry) Fault (geology) Set (abstract data type) Fault coverage Integer (computer science) Automatic test pattern generation Test set Data mining Mathematics Artificial intelligence Electronic circuit Engineering

Metrics

Cited By

0.70

FWCI (Field Weighted Citation Impact)

Refs

0.74

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Citation History

Topics

VLSI and Analog Circuit Testing

Physical Sciences → Computer Science → Hardware and Architecture

Integrated Circuits and Semiconductor Failure Analysis

Physical Sciences → Engineering → Electrical and Electronic Engineering

VLSI and FPGA Design Techniques

Physical Sciences → Engineering → Electrical and Electronic Engineering

A Novel Test Point Selection Method for Analog Fault Dictionary Techniques

Metrics

Citation History

Topics

Related Documents

Optimum test point selection method for analog fault dictionary techniques

A test points selection method for analog fault dictionary techniques

Test Points Selection for Analog Fault Dictionary Techniques

Optimum Test Point Selection Based on MADM for Analog Fault Dictionary Techniques

A new test points selection method for analog fault dictionary techniques