JOURNAL ARTICLE
Test Points Selection for Analog Fault Dictionary Techniques
Chenglin YangShulin TianBing Long
Year: 2009 Journal: Journal of Electronic Testing Vol: 25 (2-3)Pages: 157-168 Publisher: Springer Science+Business Media
Keywords:
Selection (genetic algorithm) Computer science Algorithm Set (abstract data type) Coding (social sciences) Table (database) Integer (computer science) Fault (geology) Statistical hypothesis testing Data mining Artificial intelligence Mathematics Statistics
Metrics
14
Cited By
1.51
FWCI (Field Weighted Citation Impact)
19
Refs
0.85
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Citation History
Topics
Engineering and Test Systems
Physical Sciences → Engineering → Control and Systems Engineering
Software Testing and Debugging Techniques
Physical Sciences → Computer Science → Software
VLSI and Analog Circuit Testing
Physical Sciences → Computer Science → Hardware and Architecture
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