A test points selection method for analog fault dictionary techniques

Chenglin Yang; Shulin Tian; Bing Long; Fang Chen

doi:10.1007/s10470-009-9369-8

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A test points selection method for analog fault dictionary techniques

Chenglin Yang Shulin Tian Bing Long Fang Chen

Year: 2009 Journal: Analog Integrated Circuits and Signal Processing Vol: 63 (2)Pages: 349-357 Publisher: Springer Science+Business Media

DOI: 10.1007/s10470-009-9369-8

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Keywords:

Graph Node (physics) Set (abstract data type) Selection (genetic algorithm) Test set Algorithm Computer science Automatic test pattern generation Fault coverage Mathematics Mathematical optimization Artificial intelligence Theoretical computer science Engineering Electronic circuit

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VLSI and Analog Circuit Testing

Physical Sciences → Computer Science → Hardware and Architecture

Integrated Circuits and Semiconductor Failure Analysis

Physical Sciences → Engineering → Electrical and Electronic Engineering

VLSI and FPGA Design Techniques

Physical Sciences → Engineering → Electrical and Electronic Engineering

A test points selection method for analog fault dictionary techniques

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