JOURNAL ARTICLE

A test points selection method for analog fault dictionary techniques

Chenglin YangShulin TianBing LongFang Chen

Year: 2009 Journal:   Analog Integrated Circuits and Signal Processing Vol: 63 (2)Pages: 349-357   Publisher: Springer Science+Business Media
Keywords:
Graph Node (physics) Set (abstract data type) Selection (genetic algorithm) Test set Algorithm Computer science Automatic test pattern generation Fault coverage Mathematics Mathematical optimization Artificial intelligence Theoretical computer science Engineering Electronic circuit

Metrics

12
Cited By
0.49
FWCI (Field Weighted Citation Impact)
17
Refs
0.77
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

VLSI and Analog Circuit Testing
Physical Sciences →  Computer Science →  Hardware and Architecture
Integrated Circuits and Semiconductor Failure Analysis
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
VLSI and FPGA Design Techniques
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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