JOURNAL ARTICLE

Optimum test point selection method for analog fault dictionary techniques

Sara SaeediSeyyed Hossein Pishgar KomlehMahdi Eslami

Year: 2019 Journal:   Analog Integrated Circuits and Signal Processing Vol: 100 (1)Pages: 167-179   Publisher: Springer Science+Business Media
Keywords:
Fault (geology) Fault coverage Stuck-at fault Set (abstract data type) Computer science Automatic test pattern generation Computation Algorithm Dimension (graph theory) Point (geometry) Fault detection and isolation Simple (philosophy) Table (database) Test set Selection (genetic algorithm) Engineering Mathematics Electronic circuit Data mining Artificial intelligence

Metrics

13
Cited By
0.91
FWCI (Field Weighted Citation Impact)
15
Refs
0.76
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Integrated Circuits and Semiconductor Failure Analysis
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
VLSI and Analog Circuit Testing
Physical Sciences →  Computer Science →  Hardware and Architecture
Advancements in Semiconductor Devices and Circuit Design
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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