Optimum test point selection method for analog fault dictionary techniques

Sara Saeedi; Seyyed Hossein Pishgar Komleh; Mahdi Eslami

doi:10.1007/s10470-019-01453-7

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Optimum test point selection method for analog fault dictionary techniques

Sara Saeedi Seyyed Hossein Pishgar Komleh Mahdi Eslami

Year: 2019 Journal: Analog Integrated Circuits and Signal Processing Vol: 100 (1)Pages: 167-179 Publisher: Springer Science+Business Media

DOI: 10.1007/s10470-019-01453-7

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Keywords:

Fault (geology) Fault coverage Stuck-at fault Set (abstract data type) Computer science Automatic test pattern generation Computation Algorithm Dimension (graph theory) Point (geometry) Fault detection and isolation Simple (philosophy) Table (database) Test set Selection (genetic algorithm) Engineering Mathematics Electronic circuit Data mining Artificial intelligence

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Integrated Circuits and Semiconductor Failure Analysis

Physical Sciences → Engineering → Electrical and Electronic Engineering

VLSI and Analog Circuit Testing

Physical Sciences → Computer Science → Hardware and Architecture

Advancements in Semiconductor Devices and Circuit Design

Physical Sciences → Engineering → Electrical and Electronic Engineering

Optimum test point selection method for analog fault dictionary techniques

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A test points selection method for analog fault dictionary techniques