JOURNAL ARTICLE

A new test points selection method for analog fault dictionary techniques

Dongsheng ZhaoYuzhu He

Year: 2014 Journal:   Analog Integrated Circuits and Signal Processing Vol: 82 (2)Pages: 435-448   Publisher: Springer Science+Business Media
Keywords:
Set (abstract data type) Fault (geology) Algorithm Dimension (graph theory) Point (geometry) Fault coverage Test set Automatic test pattern generation Computer science Row Computation Integer (computer science) Selection (genetic algorithm) Integer programming Fault detection and isolation Table (database) Set cover problem Mathematical optimization Mathematics Data mining Artificial intelligence Engineering Electronic circuit

Metrics

9
Cited By
0.83
FWCI (Field Weighted Citation Impact)
15
Refs
0.76
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

VLSI and Analog Circuit Testing
Physical Sciences →  Computer Science →  Hardware and Architecture
Integrated Circuits and Semiconductor Failure Analysis
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Advancements in Photolithography Techniques
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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