A new test points selection method for analog fault dictionary techniques

Dongsheng Zhao; Yuzhu He

doi:10.1007/s10470-014-0469-8

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A new test points selection method for analog fault dictionary techniques

Dongsheng Zhao Yuzhu He

Year: 2014 Journal: Analog Integrated Circuits and Signal Processing Vol: 82 (2)Pages: 435-448 Publisher: Springer Science+Business Media

DOI: 10.1007/s10470-014-0469-8

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Keywords:

Set (abstract data type) Fault (geology) Algorithm Dimension (graph theory) Point (geometry) Fault coverage Test set Automatic test pattern generation Computer science Row Computation Integer (computer science) Selection (genetic algorithm) Integer programming Fault detection and isolation Table (database) Set cover problem Mathematical optimization Mathematics Data mining Artificial intelligence Engineering Electronic circuit

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VLSI and Analog Circuit Testing

Physical Sciences → Computer Science → Hardware and Architecture

Integrated Circuits and Semiconductor Failure Analysis

Physical Sciences → Engineering → Electrical and Electronic Engineering

Advancements in Photolithography Techniques

Physical Sciences → Engineering → Electrical and Electronic Engineering

A new test points selection method for analog fault dictionary techniques

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