Electronic and optical properties of hot-wire-deposited microcrystalline silicon

R. Brüggemann; A. Hierzenberger; Peter Reinig; Markus Rojahn; M.B. Schubert; Stefan Schweizer; H.N. Wanka; I. Zrinščak

doi:10.1016/s0022-3093(98)00260-9

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Electronic and optical properties of hot-wire-deposited microcrystalline silicon

R. Brüggemann A. Hierzenberger Peter Reinig Markus Rojahn M.B. Schubert Stefan Schweizer H.N. Wanka I. Zrinščak

Year: 1998 Journal: Journal of Non-Crystalline Solids Vol: 227-230 Pages: 982-986 Publisher: Elsevier BV

DOI: 10.1016/s0022-3093(98)00260-9

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Keywords:

Materials science Monocrystalline silicon Photoconductivity Specular reflection Doping Silicon Optoelectronics Chemical vapor deposition Optics Physics

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Thin-Film Transistor Technologies

Physical Sciences → Engineering → Electrical and Electronic Engineering

Silicon Nanostructures and Photoluminescence

Physical Sciences → Materials Science → Materials Chemistry

Silicon and Solar Cell Technologies

Physical Sciences → Engineering → Electrical and Electronic Engineering

Electronic and optical properties of hot-wire-deposited microcrystalline silicon

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