J.-L. PeyreDenis RivièreC. VannierG. Villela
As the feature sizes of microelectronic and optoelectronic components continue to decrease, there has been increased interest in developing new techniques for etching the materials used to construct these highly integrated components. Features of the new techniques now being investigated include etching with neutral species, maskless processing, material selectivity, and reduced electrical damage.
C. O’DriscollRichard Dien WinfieldK. KhalfiP.V. KellyG.M. Crean
P.H. KeyP. E. DyerR.D. Greenough