Structural and photoelectrochemical properties of SrTaO2N oxynitride thin films deposited by reactive magnetron sputtering

C. Le Paven; Ahmed Ziani; Florent Marlec; Laurent Le Gendre; Franck Tessier; Mohamad Haydoura; Ratiba Benzerga; François Cheviré; Kazuhiro Takanabe; Ala Sharaiha

doi:10.1016/j.jeurceramsoc.2020.05.011

JOURNAL ARTICLE

Structural and photoelectrochemical properties of SrTaO2N oxynitride thin films deposited by reactive magnetron sputtering

C. Le Paven Ahmed Ziani Florent Marlec Laurent Le Gendre Franck Tessier Mohamad Haydoura Ratiba Benzerga François Cheviré Kazuhiro Takanabe Ala Sharaiha

Year: 2020 Journal: Journal of the European Ceramic Society Vol: 40 (16)Pages: 6301-6308 Publisher: Elsevier BV

DOI: 10.1016/j.jeurceramsoc.2020.05.011

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Keywords:

Materials science Crystallinity Crystallization Thin film Sputtering Band gap Visible spectrum Stoichiometry Optoelectronics Analytical Chemistry (journal) Chemical engineering Composite material Nanotechnology Chemistry

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Advanced Photocatalysis Techniques

Physical Sciences → Energy → Renewable Energy, Sustainability and the Environment

Electronic and Structural Properties of Oxides

Physical Sciences → Materials Science → Materials Chemistry

Ga2O3 and related materials

Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials

Structural and photoelectrochemical properties of SrTaO2N oxynitride thin films deposited by reactive magnetron sputtering

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