Structural characterization of crystalline materials by the anomalous X-ray scattering.

Takashi Sakuma; Kazumasa Sugiyama; Yoshio Waseda

doi:10.2320/materia1962.28.195

ScienceGate Book Chapters

JOURNAL ARTICLE

Structural characterization of crystalline materials by the anomalous X-ray scattering.

Takashi Sakuma Kazumasa Sugiyama Yoshio Waseda

Year: 1989 Journal: Bulletin of the Japan Institute of Metals Vol: 28 (3)Pages: 195-202 Publisher: Japan Institute of Metals

DOI: 10.2320/materia1962.28.195

Get Full-Text PDF Get Analytical Report

Keywords:

Characterization (materials science) Materials science Anomalous scattering Scattering Crystallography X-ray Condensed matter physics Nanotechnology Optics Physics Chemistry

Metrics

Cited By

0.00

FWCI (Field Weighted Citation Impact)

Refs

0.23

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Topics

X-ray Diffraction in Crystallography

Physical Sciences → Materials Science → Materials Chemistry

Structural characterization of crystalline materials by the anomalous X-ray scattering.

Metrics

Topics

Related Documents

Structural characterization of non-crystalline materials by the anomalous(resonance) X-ray scattering.

STRUCTURAL CHARACTERIZATION OF NON-CRYSTALLINE MATERIALS BY THE ANOMALOUS (RESONANCE) X-RAY SCATTERING

STRUCTURAL CHARACTERIZATION OF NON-CRYSTALLINE MATERIALS BY THE ANOMALOUS (RESONANCE) X-RAY SCATTERING

Structural characterization of non-crystalline materials by the anomalous X-ray scattering(AXS) method.

Anomalous X-ray Scattering for Materials Characterization