Structural characterization of non-crystalline materials by the anomalous(resonance) X-ray scattering.

早稲田 嘉夫

doi:10.2320/materia1962.24.922

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Structural characterization of non-crystalline materials by the anomalous(resonance) X-ray scattering.

早稲田嘉夫

Year: 1985 Journal: Bulletin of the Japan Institute of Metals Vol: 24 (11)Pages: 922-928 Publisher: Japan Institute of Metals

DOI: 10.2320/materia1962.24.922

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Keywords:

Characterization (materials science) Anomalous scattering Scattering Materials science X-ray Resonance (particle physics) Crystallography Nuclear magnetic resonance Physics Optics Chemistry Nanotechnology Atomic physics

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X-ray Diffraction in Crystallography

Physical Sciences → Materials Science → Materials Chemistry

Crystallography and Radiation Phenomena

Physical Sciences → Physics and Astronomy → Condensed Matter Physics

Structural characterization of non-crystalline materials by the anomalous(resonance) X-ray scattering.

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