Structural characterization of non-crystalline materials by the anomalous X-ray scattering(AXS) method.

Abstract

The fundamentals of anomalous X-ray scattering (AXS) and its potential power have been described with respect to the determination of the local chemical environment around a specific element as a function of radial distance in multi-component non-crystalline materials. The usefulness of this relatively new method using the anomalous dispersion effect of X-rays has been demonstrated by some selected examples of GeO2 oxide glass, Al–Ge–Mn metallic glass, and Bi2O3–CaO–Fe2O3 thin film oxide glass grown on a Si substrate. The feasibility study for crystalline materials by applying this AXS method was also given using the results of a high temperature oxide superconductor of Y–Ba–Cu–O, as an example.