JOURNAL ARTICLE
Anomalous X-ray Scattering for Materials Characterization
Year: 2003 Journal: Materials Today Vol: 6 (1)Pages: 38-38 Publisher: Elsevier BV
Keywords:
Characterization (materials science) Materials science Scattering X-ray Nanotechnology Optics Physics
Metrics
59
Cited By
3.85
FWCI (Field Weighted Citation Impact)
0
Refs
0.94
Citation Normalized Percentile
Is in top 1%
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Citation History
Topics
X-ray Diffraction in Crystallography
Physical Sciences → Materials Science → Materials Chemistry
Nuclear Physics and Applications
Physical Sciences → Physics and Astronomy → Radiation
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