JOURNAL ARTICLE

Atomically resolved scanning tunneling microscopy of hydrogen-terminated Si(001) surfaces after HF cleaning

Kenta ArimaKatsuyoshi EndoToshihiko KataokaYasushi OshikaneHaruyuki InoueYuzo Mori

Year: 2000 Journal:   Applied Physics Letters Vol: 76 (4)Pages: 463-465   Publisher: American Institute of Physics

Abstract

Atomic structures of hydrogen-terminated Si(001) surfaces after HF cleaning are investigated by scanning tunneling microscopy. It is revealed that the surface is macroscopically rough but is composed of terraces and steps. Inside a terrace, 1×1 structures are formed. This corresponds to the ideal 1×1 dihydride structure. The step edges run along the 〈110〉 direction. On the other hand, the 1×1 dihydride structure disappears when the surface is subsequently rinsed with ultrapure water, because every other dihydride row of the ideal 1×1 structure is preferentially etched in ultrapure water.

Keywords:
Scanning tunneling microscope Materials science Microscopy Silicon Nanotechnology Hydrogen Electrochemical scanning tunneling microscope Scanning probe microscopy Scanning electrochemical microscopy Scanning ion-conductance microscopy Nanolithography Scanning tunneling spectroscopy Optoelectronics Scanning electron microscope Chemistry Scanning confocal electron microscopy Optics Fabrication Electrochemistry Physical chemistry Physics

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70
Cited By
1.80
FWCI (Field Weighted Citation Impact)
11
Refs
0.86
Citation Normalized Percentile
Is in top 1%
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Citation History

Topics

Force Microscopy Techniques and Applications
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Surface and Thin Film Phenomena
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Ion-surface interactions and analysis
Physical Sciences →  Engineering →  Computational Mechanics
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