JOURNAL ARTICLE

Atomic structures of hydrogen-terminated Si(001) surfaces after wet cleaning by scanning tunneling microscopy

Katsuyoshi EndoKenta ArimaToshihiko KataokaYasushi OshikaneHaruyuki InoueYuzo Mori

Year: 1998 Journal:   Applied Physics Letters Vol: 73 (13)Pages: 1853-1855   Publisher: American Institute of Physics

Abstract

Scanning tunneling microscopy observations are performed on a H-terminated Si(001) surface treated with HF solutions and ultrapure water with very low dissolved oxygen and total organic carbon contents. Over a large area, row structures are observed in [110] and [11̄0] directions. Pyramidal-shaped etch pits are also observed, which are caused by anisotropic etching by OH ions. Detailed images clearly show 2×1 periodic structures. It is suggested that every other row of the ideally dihydride 1×1 surface is etched preferentially by OH ions. This explains the mechanism by which the smallest etch pits are formed.

Keywords:
Scanning tunneling microscope Ultrapure water Wet cleaning Etching (microfabrication) Hydrogen Ion Silicon Materials science Anisotropy Chemistry Scanning electron microscope Crystallography Analytical Chemistry (journal) Nanotechnology Optoelectronics Optics Composite material

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Citation History

Topics

Force Microscopy Techniques and Applications
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Chemical and Physical Properties of Materials
Physical Sciences →  Materials Science →  Materials Chemistry
Thin-Film Transistor Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
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