Scanning tunneling microscopy study of the hydrogen-terminated n- and p-type Si(001) surfaces

H. Fukutome; Keizo Takano; Haruyuki Yasuda; Kenzo Maehashi; Shigehiko Hasegawa; Hisao Nakashima

doi:10.1016/s0169-4332(98)00082-8

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Scanning tunneling microscopy study of the hydrogen-terminated n- and p-type Si(001) surfaces

H. Fukutome Keizo Takano Haruyuki Yasuda Kenzo Maehashi Shigehiko Hasegawa Hisao Nakashima

Year: 1998 Journal: Applied Surface Science Vol: 130-132 Pages: 346-351 Publisher: Elsevier BV

DOI: 10.1016/s0169-4332(98)00082-8

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Keywords:

Scanning tunneling microscope Hydrogen Materials science Microscopy Nanotechnology Scanning tunneling spectroscopy Electrochemical scanning tunneling microscope Scanning probe microscopy Crystallography Chemistry Optics Physics Organic chemistry

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Semiconductor materials and interfaces

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Semiconductor materials and devices

Physical Sciences → Engineering → Electrical and Electronic Engineering

Surface and Thin Film Phenomena

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Scanning tunneling microscopy study of the hydrogen-terminated n- and p-type Si(001) surfaces

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