JOURNAL ARTICLE

Low-pressure measurement limits for silicon piezoresistive circular diaphragm sensors

Yoshitaka MatsuokaYoshimi YamamotoM. TanabeS SshimadaKoji YamadaAkio YASUKAWAHidetoshi MATSUZAKA

Year: 1995 Journal:   Journal of Micromechanics and Microengineering Vol: 5 (1)Pages: 32-35   Publisher: IOP Publishing

Abstract

The lower limit to a practical measurable span is investigated for pressure sensors that have a silicon diaphragm with circular shape and employ piezoresistive gages. Output voltages and non-linearities of the sensors are analysed, taking into account the effects of the diaphragm's large deflection and the piezoresistive effect non-linearities. Based on this analysis and industrial requirements (the minimum span output voltage must be larger than 4.3 mV V-1 and non-linearities must be within +or-0.2% at the same time), it is found that the minimum span is 15 kPa.

Keywords:
Piezoresistive effect Deflection (physics) Diaphragm (acoustics) Voltage Silicon Materials science Microelectromechanical systems Pressure sensor Span (engineering) Electrical engineering Structural engineering Optoelectronics Acoustics Engineering Vibration Optics Mechanical engineering Physics

Metrics

13
Cited By
0.00
FWCI (Field Weighted Citation Impact)
7
Refs
0.18
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Advanced MEMS and NEMS Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Mechanical and Optical Resonators
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Sensor Technology and Measurement Systems
Physical Sciences →  Computer Science →  Computer Networks and Communications
© 2026 ScienceGate Book Chapters — All rights reserved.