A two‐phase testing technique for analog fault diagnosis systems

Abstract

Abstract A two‐phase testing technique is presented for analog circuit fault diagnosis systems. The proposed technique isolates the faulty linear components in the first phase and then using the computed linear component values obtained by phase 1 to determine the input‐output characteristics of nonlinear components during phase 2. The faulty nonlinear components can thus be located. This two‐phase technique takes great advantage of low computational cost since the complex characteristics of the nonlinear components are not directly involved in the calculation.