Time-domain testing strategies and fault diagnosis for analog systems

Abstract

An efficient approach is presented for functional testing and parameter estimation of analog circuits in the time domain. The test equations are based on the sensitivity matrix, which can be obtained simultaneously with the nominal solution vector. An iterative parameter estimation approach is used when the element values deviate substantially from the nominal design values. An example is given, with results based on actual measurement data. Practical considerations, including the effects of ambiguity groups, measurement errors, and time skew, are covered. The effects of ambiguity groups are shown to be very important for parameter estimation, and techniques for reducing their number or algebraically accommodating them are presented. The approach can be directly extended to nonlinear circuits.< >