JOURNAL ARTICLE

Fault Testing and Diagnosis in Analog Circuits Using Fault Dictionary Techniques

Abstract

The present study aims to test and diagnose fault in analog-based equipment including biological and medical laboratory equipment. The diagnosis has been performed using fault dictionary techniques by modern classification methods. The modern classification methods include probabilistic neural networks and wavelets. It is known that analog circuits have difficulties compared to the digital circuits due to lack of efficient fault modeling, tolerance, nonlinearity, parametric effects and other effects. In this study, the fault diagnosis by simulation before-test approach in order to obtain a very high diagnostic degree was performed.

Keywords:
Fault (geology) Analogue electronics Computer science Parametric statistics Automatic test pattern generation Stuck-at fault Artificial neural network Reliability engineering Fault coverage Probabilistic logic Electronic circuit Artificial intelligence Fault detection and isolation Engineering Electrical engineering Mathematics Statistics

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1
Cited By
0.11
FWCI (Field Weighted Citation Impact)
15
Refs
0.41
Citation Normalized Percentile
Is in top 1%
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Citation History

Topics

Integrated Circuits and Semiconductor Failure Analysis
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
VLSI and Analog Circuit Testing
Physical Sciences →  Computer Science →  Hardware and Architecture
Advancements in Semiconductor Devices and Circuit Design
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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