Analog fault diagnosis and testing by inverse problem technique

Abstract

This paper introduces a testing algorithm based on the inverse problem concept. This algorithm detects single and double parametric faults in analog circuits by estimating the actual parameter values of the CUT. To verify the effectiveness of the proposed algorithm, it is applied to the Sallen-Key second order band pass filter where all injected faults are detected and diagnostic correctly with max percentage estimation error of 0.7%. Moreover, an additive white Gaussian noise is added to the output of the tested filter to verify the advanced performance of the proposed algorithm.