Keywords:
Testability Fault (geology) Automatic test pattern generation Computer science Analogue electronics Fault coverage Stuck-at fault Line (geometry) Design for testing Algorithm Electronic circuit Computer engineering Parallel computing Fault detection and isolation Engineering Reliability engineering Mathematics Artificial intelligence Electrical engineering

Metrics

20
Cited By
7.96
FWCI (Field Weighted Citation Impact)
23
Refs
0.98
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Fault Detection and Control Systems
Physical Sciences →  Engineering →  Control and Systems Engineering
VLSI and Analog Circuit Testing
Physical Sciences →  Computer Science →  Hardware and Architecture
Engineering and Test Systems
Physical Sciences →  Engineering →  Control and Systems Engineering

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