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JOURNAL ARTICLE

Optical wafer-level testing (Conference Presentation)

Philipp‐Immanuel Dietrich Ana Isabel Machado Florian Rupp

Year: 2025 Pages: 14-14

DOI: 10.1117/12.3043303

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Keywords:

Wafer Presentation (obstetrics) Computer science Optoelectronics Materials science Medicine

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Topics

Integrated Circuits and Semiconductor Failure Analysis

Physical Sciences → Engineering → Electrical and Electronic Engineering

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