BafSP: Co-Design of Compute SRAM and Bit-Aware Data Flip Mitigation with In-Memory Sparsity Detection for SpMM

Xiaojie Li; Mingyu Wang; Yangzhan Mai; Yicong Zhang; Baiqing Zhong; Zhiyi Yu

doi:10.1109/isvlsi61997.2024.00033

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BafSP: Co-Design of Compute SRAM and Bit-Aware Data Flip Mitigation with In-Memory Sparsity Detection for SpMM

Xiaojie Li Mingyu Wang Yangzhan Mai Yicong Zhang Baiqing Zhong Zhiyi Yu

Year: 2024 Pages: 124-129

DOI: 10.1109/isvlsi61997.2024.00033

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Keywords:

Static random-access memory Computer science Random access memory Memory management Bit (key) Embedded system Parallel computing Computer hardware Semiconductor memory Computer network

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Semiconductor materials and devices

Physical Sciences → Engineering → Electrical and Electronic Engineering

Radiation Effects in Electronics

Physical Sciences → Engineering → Electrical and Electronic Engineering

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Physical Sciences → Engineering → Electrical and Electronic Engineering

BafSP: Co-Design of Compute SRAM and Bit-Aware Data Flip Mitigation with In-Memory Sparsity Detection for SpMM

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