Р.Н. РагимовА.С. КахрамановаД.Г. АраслыА.А. ХалиловаИ.Х. МамедовA. R. Khalilzade
Abstract. Ag8Ge1-xMnxTe6 solid solutions with different manganese content (x = 0; 0.05; 0.1; 0.2) were prepared by alloying and further pressing the powders under a pressure of 0.6 GPa. By the X-ray diffraction studies have shown that the introduction of manganese atoms leads to the compressibility of the Ag8Ge1-xMnxTe6 lattice. All p-type samples had high resistance below the transition at temperatures of 180 - 220 K. An increase in electrical conductivity in the range of 220 - 300 K was analyzed using the Mott ratio; at temperatures T > 320 K, semiconductor behavior is observed in all compositions. The highest thermoelectric figure of merit ZT = 0.7 at 550 K was obtained for a solid solution of the composition Ag8Ge1-xMnxTe6 (х = 0.05).
Ч. И. АбиловМ.Ш. ГасановаН.Т. ГусейноваElmira Kasumova
А. Э. ВасильевМ.Н. ЯпрынцевO. N. IvanovM. Zhezhu
О. Б. РомановаS. S. AplesninA M KharkovВ. В. КретининA.M. Zhivulko
R. N. RahimovA. S. QahramanovaD. H. AraslyА. А. ХалиловаMammadov I. Kh.A. R. Khalilzade
A. V. SotnikovВ. В. БаковецM. OhtaA. Sh. AgazhanovС. В. Станкус