JOURNAL ARTICLE
Reliability testing of BAC hybrid circuits
Year: 1978 Journal: Microelectronics Reliability Vol: 17 (4)Pages: 414-414 Publisher: Elsevier BV
Keywords:
Reliability engineering Reliability (semiconductor) Electronic circuit Computer science Engineering Electrical engineering Physics
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Topics
Integrated Circuits and Semiconductor Failure Analysis
Physical Sciences → Engineering → Electrical and Electronic Engineering
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