JOURNAL ARTICLE
Testing of mulilayer printed circuits' reliability
Year: 1970 Journal: Microelectronics Reliability Vol: 9 (6)Pages: 452-452 Publisher: Elsevier BV
Keywords:
Reliability (semiconductor) Reliability engineering Electronic circuit Computer science Engineering Electrical engineering Physics
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Topics
Sensor Technology and Measurement Systems
Physical Sciences → Computer Science → Computer Networks and Communications
Industrial Vision Systems and Defect Detection
Physical Sciences → Engineering → Industrial and Manufacturing Engineering
Surface Roughness and Optical Measurements
Physical Sciences → Engineering → Computational Mechanics
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