Data for: Optical Dispersion Study of PPDT2FBT Thin Film Using Spectroscopic Ellipsometry

Chandan Howlader

doi:10.17632/c698ptyz9d.1

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Data for: Optical Dispersion Study of PPDT2FBT Thin Film Using Spectroscopic Ellipsometry

Chandan Howlader

Year: 2020 Vol: 1

DOI: 10.17632/c698ptyz9d.1

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Abstract

This data file contains raw ellipsometry data and data from both Bsplite and GeN-OSC model.

Keywords:

Dispersion (optics) Materials science Ellipsometry Optics Thin film Optoelectronics Analytical Chemistry (journal) Physics Chemistry Nanotechnology Chromatography

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Chalcogenide Semiconductor Thin Films

Physical Sciences → Engineering → Electrical and Electronic Engineering

2D Materials and Applications

Physical Sciences → Materials Science → Materials Chemistry

Solid-state spectroscopy and crystallography

Physical Sciences → Materials Science → Materials Chemistry

Data for: Optical Dispersion Study of PPDT2FBT Thin Film Using Spectroscopic Ellipsometry

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