JOURNAL ARTICLE

Spectroscopic Ellipsometry and Optical Dispersion Analysis of Nanocrystalline CdS Thin Films

Wug-Dong Park

Year: 2018 Journal:   Transactions on Electrical and Electronic Materials Vol: 19 (4)Pages: 261-266   Publisher: Springer Science+Business Media
Keywords:
Materials science Thin film Nanocrystalline material Refractive index Ellipsometry Dispersion (optics) Annealing (glass) Analytical Chemistry (journal) Optics Oscillator strength Optoelectronics Nanotechnology Composite material Chemistry

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Citation History

Topics

Chalcogenide Semiconductor Thin Films
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Quantum Dots Synthesis And Properties
Physical Sciences →  Materials Science →  Materials Chemistry
Nonlinear Optical Materials Research
Physical Sciences →  Materials Science →  Electronic, Optical and Magnetic Materials

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