Spectroscopic Ellipsometry and Optical Dispersion Analysis of Nanocrystalline CdS Thin Films

Wug-Dong Park

doi:10.1007/s42341-018-0059-z

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Spectroscopic Ellipsometry and Optical Dispersion Analysis of Nanocrystalline CdS Thin Films

Wug-Dong Park

Year: 2018 Journal: Transactions on Electrical and Electronic Materials Vol: 19 (4)Pages: 261-266 Publisher: Springer Science+Business Media

DOI: 10.1007/s42341-018-0059-z

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Keywords:

Materials science Thin film Nanocrystalline material Refractive index Ellipsometry Dispersion (optics) Annealing (glass) Analytical Chemistry (journal) Optics Oscillator strength Optoelectronics Nanotechnology Composite material Chemistry

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Chalcogenide Semiconductor Thin Films

Physical Sciences → Engineering → Electrical and Electronic Engineering

Quantum Dots Synthesis And Properties

Physical Sciences → Materials Science → Materials Chemistry

Nonlinear Optical Materials Research

Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials

Spectroscopic Ellipsometry and Optical Dispersion Analysis of Nanocrystalline CdS Thin Films

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