Effect of SDBS on the oxidation reliability of screen-printed Cu circuits

Choong-Jae Lee; Jae-Ha Kim; Byeong-Uk Hwang; Kyung Deuk Min; Seung‐Boo Jung

doi:10.1007/s10854-019-02847-z

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Effect of SDBS on the oxidation reliability of screen-printed Cu circuits

Choong-Jae Lee Jae-Ha Kim Byeong-Uk Hwang Kyung Deuk Min Seung‐Boo Jung

Year: 2020 Journal: Journal of Materials Science Materials in Electronics Vol: 31 (4)Pages: 3035-3041 Publisher: Springer Science+Business Media

DOI: 10.1007/s10854-019-02847-z

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Keywords:

Dodecylbenzene Materials science Reliability (semiconductor) Microstructure Electronic circuit Oxide Relative humidity Electrical resistivity and conductivity Analytical Chemistry (journal) Chemical engineering Sulfonate Composite material Sodium Metallurgy Chemistry Electrical engineering Environmental chemistry

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Nanomaterials and Printing Technologies

Physical Sciences → Engineering → Electrical and Electronic Engineering

Advanced Sensor and Energy Harvesting Materials

Physical Sciences → Engineering → Biomedical Engineering

Additive Manufacturing and 3D Printing Technologies

Physical Sciences → Engineering → Automotive Engineering

Effect of SDBS on the oxidation reliability of screen-printed Cu circuits

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