JOURNAL ARTICLE

Characterization of Misfit Dislocations at Heterovalent II-VI/III-V Interfaces

B.S. McKeonXiaojuan LiuJ. K. FurdynaDavid J. Smith

Year: 2019 Journal:   Microscopy and Microanalysis Vol: 25 (S2)Pages: 2610-2611   Publisher: Oxford University Press

Abstract

Journal Article Characterization of Misfit Dislocations at Heterovalent II-VI/III-V Interfaces Get access BS McKeon, BS McKeon Department of Physics, Arizona State University, Tempe, AZ 85287, USA Corresponding author: [email protected] Search for other works by this author on: Oxford Academic Google Scholar X Liu, X Liu Department of Physics, University of Notre Dame, Notre Dame, IN 46556, USA Search for other works by this author on: Oxford Academic Google Scholar JK Furdyna, JK Furdyna Department of Physics, University of Notre Dame, Notre Dame, IN 46556, USA Search for other works by this author on: Oxford Academic Google Scholar David J Smith David J Smith Department of Physics, Arizona State University, Tempe, AZ 85287, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 2610–2611, https://doi.org/10.1017/S1431927619013783 Published: 01 August 2019

Keywords:
Library science State (computer science) Characterization (materials science) Art history Art Physics Computer science Algorithm Optics

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Topics

Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Advancements in Semiconductor Devices and Circuit Design
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Electronic and Structural Properties of Oxides
Physical Sciences →  Materials Science →  Materials Chemistry

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