Characterization and control of II-VI/III-V heterovalent interfaces

JOURNAL ARTICLE

Year: 1998 Journal: Journal of Crystal Growth Vol: 184-185 (1-2)Pages: 163-172 Publisher: Elsevier BV

DOI: 10.1016/s0022-0248(97)00755-0

Keywords:

Characterization (materials science) Materials science Chemistry Crystallography Nanotechnology

Metrics

Cited By

0.00

FWCI (Field Weighted Citation Impact)

Refs

0.44

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Semiconductor materials and devices

Physical Sciences → Engineering → Electrical and Electronic Engineering

Semiconductor Quantum Structures and Devices

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics