Multichip thinning technology with temporary bonding for multichip-to-wafer 3D integration

Abstract

Impact of temporary bonding conditions and temporary adhesive properties on mechanical stresses in multichip thinning is evaluated for high-yield multichip-to-wafer (MC2W) heterogeneous 3D integration. It turned out that no sidewall covering of chips with a temporary adhesive gives low mechanical stress to the chip edge, leading to less chipping and cracking.