MEASUREMENT OF ELECTRICAL PROPERTIES OF SINGLE-WALLED CARBON NANOTUBES BY MAKING CONTACT WITH A SCANNING FORCE MICROSCOPY TIP

Pedro Pablo; J. Colchero; Julio Gómez‐Herrero; A. M. Baró; M.T. Martínez; Wolfgang K. Maser; Ana M. Benito; Edgar Muñoz; J. Muster; S. Roth; Marko Burghard

doi:10.1142/9789812793805_0056

JOURNAL ARTICLE

MEASUREMENT OF ELECTRICAL PROPERTIES OF SINGLE-WALLED CARBON NANOTUBES BY MAKING CONTACT WITH A SCANNING FORCE MICROSCOPY TIP

Pedro Pablo J. Colchero Julio Gómez‐Herrero A. M. Baró M.T. Martínez Wolfgang K. Maser Ana M. Benito Edgar Muñoz J. Muster S. Roth Marko Burghard

Year: 2000 Pages: 443-448

DOI: 10.1142/9789812793805_0056

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Keywords:

Carbon nanotube Materials science Microscopy Scanning probe microscopy Electrical contacts Atomic force microscopy Nanotechnology Photoconductive atomic force microscopy Atomic force acoustic microscopy Non-contact atomic force microscopy Composite material Scanning electron microscope Kelvin probe force microscope Magnetic force microscope Scanning capacitance microscopy Optics Scanning confocal electron microscopy Physics

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Carbon Nanotubes in Composites

Physical Sciences → Materials Science → Materials Chemistry

Force Microscopy Techniques and Applications

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Molecular Junctions and Nanostructures

Physical Sciences → Engineering → Electrical and Electronic Engineering

MEASUREMENT OF ELECTRICAL PROPERTIES OF SINGLE-WALLED CARBON NANOTUBES BY MAKING CONTACT WITH A SCANNING FORCE MICROSCOPY TIP

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