JOURNAL ARTICLE

Visualization of single-walled carbon nanotubes electrical networks by scanning force microspy

Abstract

In this letter, a method is presented to qualitatively investigate the electrical connection between single-walled carbon nanotubes and gold electrodes. By applying a time independent bias voltage to the scanning force microscope tip, there is a clear apparent growth effect in the topography of the electrically connected carbon nanotubes. This effect is induced by the electrostatic interaction of the tip with the free charges located at the conducting areas of the surface. This is a general method that could be applied to any molecular conducting nanowire.

Keywords:
Carbon nanotube Materials science Nanotechnology Electrode Electrostatic force microscope Mechanical properties of carbon nanotubes Nanowire Visualization Voltage Biasing Atomic force microscopy Scanning electron microscope Conductive atomic force microscopy Carbon fibers Optoelectronics Composite material Nanotube Chemistry Electrical engineering

Metrics

21
Cited By
2.48
FWCI (Field Weighted Citation Impact)
17
Refs
0.89
Citation Normalized Percentile
Is in top 1%
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Citation History

Topics

Carbon Nanotubes in Composites
Physical Sciences →  Materials Science →  Materials Chemistry
Force Microscopy Techniques and Applications
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Mechanical and Optical Resonators
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
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