JOURNAL ARTICLE
Electrical characterization of single-walled carbon nanotubes with Scanning Force Microscopy
Pedro PabloManuel Martı́nezJ. ColcheroJulio Gómez‐HerreroWolfgang K. MaserAna M. BenitoEdgar MuñozA. M. Baró
Year: 2001 Journal: Materials Science and Engineering C Vol: 15 (1-2)Pages: 149-151 Publisher: Elsevier BV
Keywords:
Carbon nanotube Materials science Nanotechnology Characterization (materials science) Cantilever Conductive atomic force microscopy Mechanical properties of carbon nanotubes Scanning electron microscope Composite material Carbon fibers Indentation Kelvin probe force microscope Nanotube Atomic force microscopy
Metrics
15
Cited By
0.50
FWCI (Field Weighted Citation Impact)
14
Refs
0.62
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Citation History
Topics
Carbon Nanotubes in Composites
Physical Sciences → Materials Science → Materials Chemistry
Force Microscopy Techniques and Applications
Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics
Mechanical and Optical Resonators
Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics
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