Abstract: Effect of microstructure on interdiffusion in bimetallic Cu–Ni thin films

JOURNAL ARTICLE

Year: 1979 Journal: Journal of Vacuum Science and Technology Vol: 16 (2)Pages: 128-129 Publisher: American Institute of Physics

DOI: 10.1116/1.569884

Abstract

First Page

Keywords:

Microstructure Bimetallic strip Materials science Thin film Metallurgy Nanotechnology Metal

Cited By

0.34

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0.57

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