JOURNAL ARTICLE

Ohmic contact to p -ZnSe and p -ZnMgSSe

Shoou‐Jinn ChangWei‐Sen ChenYan‐Kuin SuR. C. TuW.H. LanHen‐Hong Chang

Year: 1999 Journal:   Electronics Letters Vol: 35 (15)Pages: 1280-1281   Publisher: Institution of Engineering and Technology

Abstract

The authors have deposited Ge/Cu onto p-ZnSe epitaxial layers, and found that the specific contact resistance is 2 × 10–4 Ωcm2 after a simple voltage stress. The authors have also deposited Ge3Cu/Pt/Au onto p-ZnSe and p-ZnMgSSe, and found that the specific contact resistance is 8 × 10–5 Ωcm2 and 3.8 × 10–5 Ωcm2 for the as-deposited Cu3Ge/Pt/Au contacts on top of the p-ZnSe and p-ZnMgSSe, respectively. It was also found that the Cu3Ge/Pt/Au on p-ZnSe is much more stable than the Cu3Ge/Pt/Au on p-ZnMgSSe.

Keywords:
Ohmic contact Epitaxy Contact resistance Materials science Optoelectronics Crystallography Chemistry Nanotechnology Layer (electronics)

Metrics

9
Cited By
1.05
FWCI (Field Weighted Citation Impact)
4
Refs
0.78
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Semiconductor materials and interfaces
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Semiconductor Quantum Structures and Devices
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics

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