An approach for selection of test points for analog fault diagnosis

Abstract

This paper presents an algorithm for the selection of test points in frequency domain analysis of analog circuits. The proposed algorithm aims to find an optimum number of test points to isolate faults based on minimization of ambiguity groups using an information measure. This technique can be used for identifying catastrophic faults. The algorithm is composed of two stages. In the first stage, a fault dictionary is created and in the second stage, the required test points are selected based on the information measure provided by the test points. Two example circuits are presented to demonstrate the effectiveness of the proposed algorithm.