JOURNAL ARTICLE

HAREM: High aspect ratio etching and metallization

Edin SarajlicChristophe YamahataMauricio CorderoDominique CollardHiroyuki Fujita

Year: 2008 Journal:   Proceedings, IEEE micro electro mechanical systems Vol: 40 Pages: 315-318   Publisher: Institute of Electrical and Electronics Engineers

Abstract

We report a novel bulk micromachining method for the fabrication of high aspect ratio monocrystalline silicon MicroElectroMechanical Systems (MEMS) on a standard silicon wafer. The two-mask process combines double-side etching and metallization to create a micromechanical system with 'insulating walls' on its backside. The insulating walls ensure a proper electrical insulation between the different actuation and sensing elements situated on either fixed or movable parts of the device. To demonstrate the many potential applications of this simple microfabrication method, we have machined and characterized electrostatically actuated microtweezers with an integrated differential capacitive sensor.

Keywords:
Microelectromechanical systems Materials science Etching (microfabrication) Fabrication Surface micromachining Microfabrication Wafer Silicon Optoelectronics Aspect ratio (aeronautics) Monocrystalline silicon Capacitive sensing Bulk micromachining Mechanical engineering Nanotechnology Electrical engineering Engineering

Metrics

1
Cited By
0.29
FWCI (Field Weighted Citation Impact)
9
Refs
0.65
Citation Normalized Percentile
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Topics

Advanced MEMS and NEMS Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Mechanical and Optical Resonators
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Force Microscopy Techniques and Applications
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics

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