JOURNAL ARTICLE

High-Frequency Gate-All-Around Vertical InAs Nanowire MOSFETs on Si Substrates

Sofia JohanssonElvedin MemiševićLars‐Erik WernerssonErik Lind

Year: 2014 Journal:   IEEE Electron Device Letters Vol: 35 (5)Pages: 518-520   Publisher: Institute of Electrical and Electronics Engineers

Abstract

We demonstrate a vertical InAs nanowire MOSFET integrated on Si substrate with an extrinsic peak cut-off frequency of 103 GHz and a maximum oscillation frequency of 155 GHz. The transistor has a transconductance of 730 mS/mm and is based on arrays of nanowires with gate-all-around and high-kappa gate dielectric. Furthermore, small-signal modeling shows a similar to 80% reduction of the total parasitic gate capacitance when the metal pad overlap in the transistors is reduced through additional patterning.

Keywords:
Transconductance Nanowire Materials science Optoelectronics MOSFET Capacitance Gate dielectric Oscillation (cell signaling) Transistor Substrate (aquarium) Dielectric Metal gate Parasitic capacitance Electrical engineering Gate oxide Voltage Electrode Physics Engineering Chemistry

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8
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0.98
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Citation History

Topics

Advancements in Semiconductor Devices and Circuit Design
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Nanowire Synthesis and Applications
Physical Sciences →  Engineering →  Biomedical Engineering
Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
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