JOURNAL ARTICLE

Low-temperature powder diffraction studies using synchrotron radiation

Andrew N. FitchJeremy K. Cockcroft

Year: 1992 Journal:   Phase Transitions Vol: 39 (1-4)Pages: 161-170   Publisher: Taylor & Francis

Abstract

Abstract The use of high-resolution powder diffraction with synchrotron radiation to study phase transitions at low temperature is illustrated by reference to some preliminary work carried out using the diffractometer 8.3 at Daresbury Laboratory. The high quality of the data collected leads to rapid and unambiguous indexing of the diffraction patterns of low-temperature phases. Structure solution and structure refinement are also possible using data collected by this method. The examples discussed are the low temperature phases of norbornane, KPF6, (ND4)2 PtBr6 and Ni(NH3)6I2.

Keywords:
Diffractometer Synchrotron radiation Diffraction Powder diffraction Materials science Powder Diffractometer Synchrotron X-ray crystallography Norbornane Crystallography Analytical Chemistry (journal) Optics Chemistry Crystal structure Physics

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9
Cited By
1.32
FWCI (Field Weighted Citation Impact)
28
Refs
0.81
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

X-ray Diffraction in Crystallography
Physical Sciences →  Materials Science →  Materials Chemistry
Inorganic Fluorides and Related Compounds
Physical Sciences →  Chemistry →  Inorganic Chemistry
Crystallography and molecular interactions
Physical Sciences →  Chemistry →  Physical and Theoretical Chemistry

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