JOURNAL ARTICLE

Powder Diffraction using Synchrotron Radiation

M. Hart

Year: 1991 Journal:   Materials science forum Vol: 79-82 Pages: 447-454   Publisher: Trans Tech Publications

Abstract

Synchrotron radiation sources have sufficient brightness to permit the construction of aberration free diffractometers with perfectly symmetric instrument resolution functions. This paper outlines the development of one such general purpose instrument. It combines X-ray optical and mechanical simplicity with versatility, high speed and adequate resolution for general purpose measurements in both angle scanning and energy scanning data collection modes of operation. These ideas were developed as part of a long term collaboration with W. Parrish of I.B.M. San Jose at the Stanford Synchrotron Radiation Facility and an instrument with identical X-ray optics has been avairable for users at Daresbury Laboratory for several years.

Keywords:
Synchrotron radiation Optics Synchrotron Brightness Diffraction Materials science Synchrotron Radiation Source Resolution (logic) Radiation Physics Computer science

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Topics

X-ray Diffraction in Crystallography
Physical Sciences →  Materials Science →  Materials Chemistry
Microstructure and Mechanical Properties of Steels
Physical Sciences →  Engineering →  Mechanical Engineering
Advanced X-ray Imaging Techniques
Physical Sciences →  Physics and Astronomy →  Radiation

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