JOURNAL ARTICLE

X-ray powder diffraction studies using synchrotron and conventional radiation sources

Paul ThompsonA. M. Glazer

Year: 1981 Journal:   Acta Crystallographica Section A Foundations of Crystallography Vol: 37 (a1)Pages: C306-C306   Publisher: Wiley

Abstract

The EXAFS technique penoits specification of the local structure around an X-ray absorbing atom$ It has been applied, with notable success, to a 1;vide range of problems involving ordered and disordered systems of interest in materials science.This paper will first revie~v the status of structural determinations.The accuracy of determining radial distances to, and number and identity of, coordinating species will be examined.Methods of analyzing systems in which the distribution of atoms is asy~rnetrical will be discussed.Theoretical progress in including ~ultielectron and inelastic effects in the EXAFS for~alisrn will be summarized.Near edge spectroscopy, which is concerned with the

Keywords:
Synchrotron radiation Powder diffraction Materials science X-ray Synchrotron Diffraction Radiation Optics Physics Nuclear magnetic resonance

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Topics

X-ray Diffraction in Crystallography
Physical Sciences →  Materials Science →  Materials Chemistry
Crystallography and Radiation Phenomena
Physical Sciences →  Physics and Astronomy →  Condensed Matter Physics
Powder Metallurgy Techniques and Materials
Physical Sciences →  Engineering →  Mechanical Engineering

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