Reliable method for delay-fault diagnosis

Patrick Girard; C. Landrault; S. Pravossoudovitch

doi:10.1049/el:19911144

ScienceGate Book Chapters

JOURNAL ARTICLE

Reliable method for delay-fault diagnosis

Patrick Girard C. Landrault S. Pravossoudovitch

Year: 1991 Journal: Electronics Letters Vol: 27 (20)Pages: 1841-1843 Publisher: Institution of Engineering and Technology

DOI: 10.1049/el:19911144

Get Full-Text PDF Get Analytical Report

Abstract

The class of faults known as delay faults is investigated. The diagnosis process is performed after the detection of a circuit malfunction. Unfortunately, the existing methods for locating timing failures on digital circuits have shown certain deficiencies. A new and perfectly reliable method for delay fault diagnosis, based on the symbolic simulation of the fault-free circuit, is presented.

Keywords:

Fault (geology) Computer science Reliability engineering Stuck-at fault Delay calculation Digital electronics Process (computing) Fault model Fault indicator Electronic circuit Fault detection and isolation Electronic engineering Propagation delay Engineering Electrical engineering Artificial intelligence Actuator

Metrics

Cited By

0.00

FWCI (Field Weighted Citation Impact)

Refs

0.18

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Topics

VLSI and Analog Circuit Testing

Physical Sciences → Computer Science → Hardware and Architecture

Integrated Circuits and Semiconductor Failure Analysis

Physical Sciences → Engineering → Electrical and Electronic Engineering

VLSI and FPGA Design Techniques

Physical Sciences → Engineering → Electrical and Electronic Engineering

Reliable method for delay-fault diagnosis

Abstract

Metrics

Topics

Related Documents

A New Reliable Method for Delay-Fault Diagnosis

Delay Fault Diagnosis

Reliable Fault Diagnosis with Few Tests

Reliable fault diagnosis method using ensemble fuzzy ARTMAP based on improved Bayesian belief method

Delay fault diagnosis using timing information