Keywords:
Chip Fault (geology) Set (abstract data type) Computer science Fault coverage Algorithm Delay calculation Context (archaeology) Automatic test pattern generation Test set Reliability engineering Electronic engineering Electronic circuit Propagation delay Engineering Electrical engineering Artificial intelligence Telecommunications

Metrics

0
Cited By
0.00
FWCI (Field Weighted Citation Impact)
0
Refs
0.06
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Fault Detection and Control Systems
Physical Sciences →  Engineering →  Control and Systems Engineering
Engineering and Test Systems
Physical Sciences →  Engineering →  Control and Systems Engineering
Software System Performance and Reliability
Physical Sciences →  Computer Science →  Computer Networks and Communications

Related Documents

JOURNAL ARTICLE

Timing-Aware Multiple-Delay-Fault Diagnosis

Vishal MehtaMalgorzata Marek-SadowskaKun-Han TsaiJ. Rajski

Journal:   IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Year: 2009 Vol: 28 (2)Pages: 245-258
JOURNAL ARTICLE

Reliable method for delay-fault diagnosis

Patrick GirardC. LandraultS. Pravossoudovitch

Journal:   Electronics Letters Year: 1991 Vol: 27 (20)Pages: 1841-1843
© 2026 ScienceGate Book Chapters — All rights reserved.