Amorphous molybdenum oxysulfide thin films and their physical characterization

Evanthia Kalpazidou Schmidt; C. Sourisseau; Gérard Meunier; A. Levasseur

doi:10.1016/0040-6090(94)06463-6

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Amorphous molybdenum oxysulfide thin films and their physical characterization

Evanthia Kalpazidou Schmidt C. Sourisseau Gérard Meunier A. Levasseur

Year: 1995 Journal: Thin Solid Films Vol: 260 (1)Pages: 21-25 Publisher: Elsevier BV

DOI: 10.1016/0040-6090(94)06463-6

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Keywords:

Molybdenum Amorphous solid X-ray photoelectron spectroscopy Sputtering Sulfur Oxygen Materials science Sulfide Chemical composition Analytical Chemistry (journal) Thin film Partial pressure Inorganic chemistry Chemistry Chemical engineering Metallurgy Nanotechnology Crystallography Environmental chemistry

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Transition Metal Oxide Nanomaterials

Physical Sciences → Materials Science → Polymers and Plastics

Glass properties and applications

Physical Sciences → Materials Science → Ceramics and Composites

Chalcogenide Semiconductor Thin Films

Physical Sciences → Engineering → Electrical and Electronic Engineering

Amorphous molybdenum oxysulfide thin films and their physical characterization

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