New amorphous molybdenum oxysulfide thin films their characterization and their electrochemical properties

A. Levasseur; Evanthia Kalpazidou Schmidt; Gérard Meunier; D. Gonbeau; Luc Benoist; G. Pfister‐Guillouzo

doi:10.1016/0378-7753(94)02100-h

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New amorphous molybdenum oxysulfide thin films their characterization and their electrochemical properties

A. Levasseur Evanthia Kalpazidou Schmidt Gérard Meunier D. Gonbeau Luc Benoist G. Pfister‐Guillouzo

Year: 1995 Journal: Journal of Power Sources Vol: 54 (2)Pages: 352-355 Publisher: Elsevier BV

DOI: 10.1016/0378-7753(94)02100-h

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Keywords:

X-ray photoelectron spectroscopy Amorphous solid Molybdenum Intercalation (chemistry) Lithium (medication) Molybdenum disulfide Oxygen Electrochemistry Partial pressure Materials science Inorganic chemistry Thin film Sputtering Redox Analytical Chemistry (journal) Chemistry Chemical engineering Crystallography Nanotechnology Metallurgy Electrode Physical chemistry

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Advancements in Battery Materials

Physical Sciences → Engineering → Electrical and Electronic Engineering

Advanced Battery Materials and Technologies

Physical Sciences → Engineering → Electrical and Electronic Engineering

Semiconductor materials and interfaces

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

New amorphous molybdenum oxysulfide thin films their characterization and their electrochemical properties

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