XPS analysis of oxido-reduction mechanisms during lithium intercalation in amorphous molybdenum oxysulfide thin films

Luc Benoist

doi:10.1016/0167-2738(94)00226-i

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XPS analysis of oxido-reduction mechanisms during lithium intercalation in amorphous molybdenum oxysulfide thin films

Luc Benoist

Year: 1995 Journal: Solid State Ionics Vol: 76 (1-2)Pages: 81-89 Publisher: Elsevier BV

DOI: 10.1016/0167-2738(94)00226-i

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Keywords:

X-ray photoelectron spectroscopy Molybdenum Intercalation (chemistry) Molybdenum disulfide Amorphous solid Lithium (medication) Thin film Inorganic chemistry Redox Materials science Chemistry Chemical engineering Crystallography Nanotechnology Metallurgy

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Advancements in Battery Materials

Physical Sciences → Engineering → Electrical and Electronic Engineering

Semiconductor materials and interfaces

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Advanced Battery Materials and Technologies

Physical Sciences → Engineering → Electrical and Electronic Engineering

XPS analysis of oxido-reduction mechanisms during lithium intercalation in amorphous molybdenum oxysulfide thin films

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