XPS analysis of the lithium intercalation in amorphous tungsten oxysulfide thin films

Inocencio R. Martín; Philippe Vinatier; A. Levasseur; Jean‐Charles Dupin; D. Gonbeau

doi:10.1016/s0378-7753(99)00129-9

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XPS analysis of the lithium intercalation in amorphous tungsten oxysulfide thin films

Inocencio R. Martín Philippe Vinatier A. Levasseur Jean‐Charles Dupin D. Gonbeau

Year: 1999 Journal: Journal of Power Sources Vol: 81-82 Pages: 306-311 Publisher: Elsevier BV

DOI: 10.1016/s0378-7753(99)00129-9

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Keywords:

X-ray photoelectron spectroscopy Amorphous solid Tungsten Thin film Sputtering Intercalation (chemistry) Lithium (medication) Materials science Analytical Chemistry (journal) Sputter deposition Oxygen Tungsten Compounds Inorganic chemistry Chemistry Chemical engineering Metallurgy Nanotechnology Crystallography Environmental chemistry

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Semiconductor materials and interfaces

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Advancements in Battery Materials

Physical Sciences → Engineering → Electrical and Electronic Engineering

Advanced Battery Materials and Technologies

Physical Sciences → Engineering → Electrical and Electronic Engineering

XPS analysis of the lithium intercalation in amorphous tungsten oxysulfide thin films

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