Characterization of films and interfaces in n-ZnO/p-Si photodiodes

J.Y. Lee; Youngsu Choi; Wooyoung Choi; Han Woong Yeom; Young Keun Yoon; Jong Hoon Kim; Seongil Im

doi:10.1016/s0040-6090(02)00742-3

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Characterization of films and interfaces in n-ZnO/p-Si photodiodes

J.Y. Lee Youngsu Choi Wooyoung Choi Han Woong Yeom Young Keun Yoon Jong Hoon Kim Seongil Im

Year: 2002 Journal: Thin Solid Films Vol: 420-421 Pages: 112-116 Publisher: Elsevier BV

DOI: 10.1016/s0040-6090(02)00742-3

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Keywords:

Materials science Photodiode Optoelectronics Heterojunction X-ray photoelectron spectroscopy Diode Quantum efficiency Photoelectric effect Photoluminescence Substrate (aquarium) Transmittance Sputtering Thin film Nanotechnology

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ZnO doping and properties

Physical Sciences → Materials Science → Materials Chemistry

Ga2O3 and related materials

Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials

Copper-based nanomaterials and applications

Physical Sciences → Materials Science → Materials Chemistry

Characterization of films and interfaces in n-ZnO/p-Si photodiodes

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